Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

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$9.60 - $300.00
UPC:
9780387258003
Binding:
Hardcover
Note:
Used books may not include companion materials/CD/Code etc, items in good condition.We ship orders daily and Customer Service is our top priority!
Publication Date:
2/11/2011
Author:
R.F. Egerton
Language:
english
Edition:
1st ed. 2005. Corr. 2nd printing 2011
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Product Overview

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and inner space. Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.